Onur enjoyed giving the keynote talk on Rowhammer and Beyond at the 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, October 2 – October 4, 2019, ESA-ESTEC & TU Delft, Netherlands
[Slides (pptx)] (pdf)]
[Related Overview Paper (IEEE TCAD 2019)]
